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Architecture, defect tolerance, and buffer design for a new ATM switch

✍ Scribed by Jain, V.K.; Lei Lin; Horiguchi, S.

Book ID: 114561995
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 436 KB
Volume: 21
Category: Article
ISSN: 1070-9894
DOI: 10.1109/96.730414

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