𝔖 Bobbio Scriptorium
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Applications of the concentration depth profiling with PIXE

✍ Scribed by M. Jakšić; M. Vajić; V. Valković

Book ID
113280674
Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
319 KB
Volume
49
Category
Article
ISSN
0168-583X

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A method to apply particle induced X-ray emission (PIXE) for depth profiling, based on the variation of the X-ray detection angle, is proposed. The procedure uses X-ray yields normalized to those emitted at a particular reference angle. Application of the method to implanted samples and thin metalli