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Application of X-ray photoelectron spectroscopy to characterization of Au nanoparticles formed by ion implantation into SiO2

✍ Scribed by K. Takahiro; S. Oizumi; K. Morimoto; K. Kawatsura; T. Isshiki; K. Nishio; S. Nagata; S. Yamamoto; K. Narumi; H. Naramoto

Book ID: 108064018
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 429 KB
Volume: 256
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2009.05.104

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