X-ray photoelectron spectroscopy characterization of oxidated Si particles formed by pulsed ion-beam ablation

✍ Scribed by X.P. Zhu; Tomiyuki Yukawa; Makoto Hirai; Hisayuki Suematsu; Weihua Jiang; Kiyoshi Yatsui; H. Nishiyama; Y. Inoue

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 204 KB
• Volume: 252
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2005.07.040