Effect of develop time on process window
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G. Arthur; B. Martin; C. Wallace
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Article
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1999
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Elsevier Science
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English
⚖ 288 KB
The effect of develop time (DT) on process control of the sub-half-micron optical lithography step of a production CMOS process is examined. It is shown that develop times greater than those generally used increase the depth-of-focus (DOF), exposure latitude (EL), linearity, exposure margin and resi