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Application of the simulator “XMAS” on specific problems in sub-half-micron lithography

✍ Scribed by H. Oertel; H. Betz; A. Heuberger


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
722 KB
Volume
3
Category
Article
ISSN
0167-9317

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Effect of develop time on process window
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The effect of develop time (DT) on process control of the sub-half-micron optical lithography step of a production CMOS process is examined. It is shown that develop times greater than those generally used increase the depth-of-focus (DOF), exposure latitude (EL), linearity, exposure margin and resi