Application of the Method of Steepest Descents to X-Ray Structure Analysis
β Scribed by BOOTH, A. D.
- Book ID
- 109551859
- Publisher
- Nature Publishing Group
- Year
- 1947
- Tongue
- English
- Weight
- 116 KB
- Volume
- 160
- Category
- Article
- ISSN
- 0028-0836
- DOI
- 10.1038/160196a0
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π SIMILAR VOLUMES
The invariant embedding principle was applied to obtain closed analytical expressions of several magnitudes of interest in electron probe microanalysis [ ionization distribution function, /(qz) backscattering probability, etc. ] . This approach permits one easily to obtain solutions for a model whic
X-ray microΓuorescence provides the analytical scientist with a powerful tool to solve a variety of materials-based problems. Spatially resolved non-destructive elemental analyses can rapidly address a number of problems using qualitative analysis. Point spectra, line proΓles and elemental maps o β e