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Application of scanning thermal microscopy for thermal conductivity measurements on meso-porous silicon thin films

✍ Scribed by Gomès, S; David, L; Lysenko, V; Descamps, A; Nychyporuk, T; Raynaud, M

Book ID: 121495908
Publisher: Institute of Physics
Year: 2007
Tongue: English
Weight: 289 KB
Volume: 40
Category: Article
ISSN: 0022-3727
DOI: 10.1088/0022-3727/40/21/029

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