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Application of Raman spectroscopy for measurement of photorefractive damage profile in LiNbO3 crystals

โœ Scribed by S.M. Kostritskii; P. Bourson; M. D. Fontana; R. Mouras; M. Aillerie

Publisher
John Wiley and Sons
Year
2004
Tongue
English
Weight
160 KB
Volume
1
Category
Article
ISSN
1862-6351

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Application of micro-Raman spectroscopy
Application of micro-Raman spectroscopy for the evaluation of doping profile in Zn ฮด-doped GaAs structures
โœ R. Srnanek; G. Irmer; D. Donoval; J. Osvald; D. Mc Phail; A. Christoffi; B. Scia ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 414 KB

Micro-Raman spectroscopy was used to characterize beveled Zn delta (d)-doped GaAs structures. By adapting procedures previously developed for the study of Si d-doped GaAs structures, Zn-doping profiles were obtained for a set of structures prepared with different doping levels. Values of the doping