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Application of MeV carbon ions for PIXE measurements in silicon and high-Tc superconductors

✍ Scribed by T. Tadić; D. Dujmić; M. Jaksˇić; V. Valković; C. Manfredotti

Book ID: 113287039
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 235 KB
Volume: 109-110
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(95)00973-6

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