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Application of high-resolution X-ray diffractornetry to the structural study of epitaxial multilayers on novel index surfaces

✍ Scribed by A. Sanz-Hervás; M. Garrido; M. Aguilar; A. Sacedón; J.L. Sánchez-Rojas; E. Calleja; E. Muñoz; C. Villar; E.J. Abril; M. López

Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 489 KB
Volume: 28
Category: Article
ISSN: 0026-2692
DOI: 10.1016/s0026-2692(96)00116-4

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