The phenomenal success of atomic force microscopy (AFM) in industry is based on the easy access of samples with practical interest due to the high resolution and high contrast of the method under controllable ambient conditions. In our case, the high resolution of AFM is mainly used in the mesoscale
✦ LIBER ✦
Application of atomic force microscopy for microindentation testing
✍ Scribed by M. Petzold; J. Landgraf; M. Füting; J.M. Olaf
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 1018 KB
- Volume
- 264
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
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