Application of the needle sensor for microstructure measurements and atomic force microscopy
โ Scribed by U. Grunewald; K. Bartzke; T. Antrack
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 312 KB
- Volume
- 264
- Category
- Article
- ISSN
- 0040-6090
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