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Application of a MeV nickel ion beam for PIXE analysis of iron near the surface of a silicon wafer

✍ Scribed by Y. Horino; Y. Mokuno; A. Kinomura; A. Chayahara; K. Fujii

Book ID
113286229
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
290 KB
Volume
100
Category
Article
ISSN
0168-583X

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