𝔖 Bobbio Scriptorium
✦   LIBER   ✦

A comparison between the use of MeV ion beams and synchrotron radiation for element analysis

✍ Scribed by R.D. Vis


Book ID
113284310
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
652 KB
Volume
75
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


MeV-ion beam analysis of the interface b
✍ T. Kamwanna; N. Pasaja; L.D. Yu; T. Vilaithong; A. Anders; S. Singkarat πŸ“‚ Article πŸ“… 2008 πŸ› Elsevier Science 🌐 English βš– 703 KB

Amorphous carbon (a-C) films were deposited on Si(1 0 0) wafers by a filtered cathodic vacuum arc (FCVA) plasma source. A negative electrical bias was applied to the silicon substrate in order to control the incident energy of carbon ions. Effects of the electrical bias on the a-C/Si interface chara