Apparent Band-Gap Narrowing and Its Data Derived from the Measurements of Minority-Carrier Current Density in Heavily Doped Emitters of Silicon Devices

✍ Scribed by Van Cong, H. ;Debiais, G.

• Publisher: John Wiley and Sons
• Year: 1996
• Tongue: English
• Weight: 365 KB
• Volume: 155
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211550229