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ANSYS based 3D electro-thermal simulations for the evaluation of power MOSFETs robustness

✍ Scribed by Stefano de Filippis; Vladimír Košel; Donald Dibra; Stefan Decker; Helmut Köck; Andrea Irace


Book ID
113800516
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
878 KB
Volume
51
Category
Article
ISSN
0026-2714

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