3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET

✍ Scribed by Sauveplane, J.B.; Tounsi, P.; Scheid, E.; Deram, A.

• Book ID: 108210763
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 615 KB
• Volume: 48
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2008.06.022