Anomalous Hot-Carrier-Induced Increase in Saturation-Region Drain Current in n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors

✍ Scribed by Shiang-Yu Chen; Chen, J.F.; Lee, J.R.; Kuo-Ming Wu; Liu, C.M.; Hsu, S.L.

• Book ID: 114619366
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 727 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.918416