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Anomalous degradation of MOS structures in substrate hot electron injection experiments

✍ Scribed by Tomasz Brożzek; Daniel Hahn; Chand R. Viswanathan

Book ID: 103599424
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 381 KB
Volume: 28
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(95)00071-f

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