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Annealing temperature effects on the electrical characteristics of p-channel polysilicon thin film transistors

✍ Scribed by M. Cuscunà; G. Stracci; A. Bonfiglietti; A. di Gaspare; L. Maiolo; A. Pecora; L. Mariucci; G. Fortunato

Book ID: 116668921
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 183 KB
Volume: 352
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2005.10.050

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