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Annealing effect on the bipolar resistive switching behaviors of BiFeO3 thin films on LaNiO3-buffered Si substrates

✍ Scribed by Xinman Chen; Hu Zhang; Kaibin Ruan; Wangzhou Shi

Book ID: 116609203
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 858 KB
Volume: 529
Category: Article
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2012.03.014

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