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Effect of LaNiO3 buffer layer thickness on the microstructure and electrical properties of (100)-oriented BaTiO3 thin films on Si substrate

✍ Scribed by Liang Qiao; Xiaofang Bi

Book ID: 108290350
Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 823 KB
Volume: 517
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2008.12.056

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