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Angle resolved X-ray photoelectron spectroscopic study of ultrathin oxynitrides

✍ Scribed by K Kawase; J Tanimura; H Kurokawa; K Kobayashi; A Teramoto; T Ogata; M Inoue


Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
216 KB
Volume
2
Category
Article
ISSN
1369-8001

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## Abstract Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) has been used to study the composition of oxides grown on γ€ˆ110〉 and γ€ˆ100〉 GaAs during exposure to UV/ozone. The effects of substrate treatments on oxide growth were compared on γ€ˆ100〉 surfaces exposed to an HF treatment and thermal