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Analytical drain current model for nanoscale strained‐Si/SiGe MOSFETs

✍ Scribed by Batwani, Himanshu; Gaur, Mayank; Jagadesh Kumar, M.


Book ID
123622292
Publisher
Emerald Group Publishing Limited
Year
2009
Tongue
English
Weight
464 KB
Volume
28
Category
Article
ISSN
0332-1649

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