Analytical Approximation for Calculating Secondary Fluorescence in X-Ray Fluorescence Analysis of Powdered Materials
β Scribed by A. L. Finkelshtein; V. P. Afonin
- Book ID
- 111989698
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 391 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0049-8246
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Sherman's fundamental equations were used in deriving an approximate expression for calculating the xray fluorescence intensity of elements. The error of approximate calculations relative to the fundamental equations is a few hundredths of 1% if the fluorescent material does not contain elements who
## Total Reflection X-ray Fluorescence (TXRF) is a variant of Energy dispersive X-ray Fluorescence (EDXRF). It is a comparatively new method of trace element analysis and finds its application in various research areas of material development and processing. The versatility of TXRF is due to (i.) r
Specimen preparation is the source of the largest errors in x-ray Γuorescence analysis. This paper reviews recent publications which deal with various methods of specimen preparation for the analysis of powders, compacted samples and fused specimens, non-destructive analysis of solid samples, direct