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Analytical analysis of nanoscale fully depleted Double-Gate MOSFETs including the hot-carrier degradation effects

✍ Scribed by Ghoggali, Z.; Djeffal, F.

Book ID: 121471867
Publisher: Taylor and Francis Group
Year: 2010
Tongue: English
Weight: 408 KB
Volume: 97
Category: Article
ISSN: 0020-7217
DOI: 10.1080/00207210902894746

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