Two-dimensional numerical analysis of nanoscale junctionless and conventional Double Gate MOSFETs including the effect of interfacial traps

✍ Scribed by Elasaad Chebaki; Fayçal Djeffal; Toufik Bentrcia

• Book ID: 115561618
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 187 KB
• Volume: 9
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.201200128