✦ LIBER ✦
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects
✍ Scribed by F. Djeffal; T. Bentrcia; M.A. Abdi; T. Bendib
- Book ID
- 108210919
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 379 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0026-2714
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