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Analysis of the surfaces structure in porous Si

✍ Scribed by M. Schoisswohl; H.J. von Bardeleben; V. Morazzani; A. Grosman; C. Ortega; St. Frohnhoff; M.G. Berger; H. Münder


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
497 KB
Volume
255
Category
Article
ISSN
0040-6090

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The work demonstrates that the surface atom layers of variously-prepared samples of porous silicon can, after high-temperature heat treatment in high vacuum, yield low energy electron diffraction patterns and also atomic resolution in scanning tunneling microscopy. The (100) surfaces show some patch