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Analysis of the interface of hydrogenated amorphous carbon films on silicon by angle-resolved x-ray photoelectron spectroscopy

✍ Scribed by M. Kawasaki; G.J. Vandentop; M. Salmeron; G.A. Somorjai

Book ID: 119481588
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 443 KB
Volume: 227
Category: Article
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(05)80013-5

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