Auger electron and x-ray photoelectron spectroscopy analysis of the hydrogenated amorphous silicon-tin oxide interface: Evidence of a plasma-induced reaction

✍ Scribed by Thomas, J. H.

• Book ID: 120922660
• Publisher: American Institute of Physics
• Year: 1983
• Tongue: English
• Weight: 365 KB
• Volume: 43
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.94143