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Analysis of the Effects of Fringing Electric Field on FinFET Device Performance and Structural Optimization Using 3-D Simulation

✍ Scribed by Hui Zhao; Yee-Chia Yeo; Rustagi, S.C.; Samudra, G.S.

Book ID: 114619379
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 688 KB
Volume: 55
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2008.919308

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