Analysis of the effect of mechanical stress on the effective mobility of charge carriers in inversion layers of P/MOS structures : Wojciech Wlodarski and Bogdan Moeschke. Electron. Technol.12 (3) 31 (1979)

• Book ID: 107829256
• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 131 KB
• Volume: 21
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(81)90193-1