๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Analysis of the effect of mechanical stress on the effective mobility of charge carriers in inversion layers of P/MOS structures: Wojciech Wlodarski and Bogdan Moeschke Electron. Technol. 12(3) 31 (1979)


Book ID
104157074
Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
104 KB
Volume
14
Category
Article
ISSN
0026-2692

No coin nor oath required. For personal study only.

โœฆ Synopsis


Britain takes the lead on hybrid components Electron. Prod. p. 5 (August 1981).