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Analysis of the composition of (Al,Ga)As alloys by secondary ion mass spectroscopy and X-ray diffractometry

✍ Scribed by Drozdov, Yu. N.; Drozdov, M. N.; Daniltsev, V. M.; Khrikin, O. I.; Yunin, P. A.


Book ID
120344533
Publisher
Springer
Year
2012
Tongue
English
Weight
169 KB
Volume
46
Category
Article
ISSN
1063-7826

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