๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Analysis of the composite structures in diamond thin films by Raman spectroscopy

โœ Scribed by Shroder, R. E.; Nemanich, R. J.; Glass, J. T.

Book ID
120542532
Publisher
The American Physical Society
Year
1990
Tongue
English
Weight
426 KB
Volume
41
Category
Article
ISSN
1098-0121

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Thickness dependence of the structure of
Thickness dependence of the structure of diamond-like carbon films by Raman spectroscopy
โœ Fan-Xin Liu; Zhen-Lin Wang ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 610 KB

The thickness dependence on structure of Diamond-like carbon films of a-C:H deposited by ECR-CVD and ta-C by FCVA has been studied by visible and UV Raman spectroscopy. The results show that the evolution of structure as a function of the thickness for a-C:H films contains two stages: when thickness

Structural study of TiO2 thin films by m
Structural study of TiO2 thin films by micro-Raman spectroscopy
โœ Niilisk, Ahti ;Moppel, Mart ;Pรคrs, Martti ;Sildos, Ilmo ;Jantson, Taavi ;Avarmaa ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Walter de Gruyter GmbH ๐ŸŒ English โš– 269 KB

The Raman spectroscopy method was used for structural characterization of TiO 2 thin films prepared by atomic layer deposition (ALD) and pulsed laser deposition (PLD) on fused silica and single-crystal silicon and sapphire substrates. Using ALD, anatase thin films were grown on silica and silicon su