Analysis of temperature-dependent electrical characteristics in amorphous In-Ga-Zn-O thin-film transistors using gated-four-probe measurements

✍ Scribed by Jeong, Jaewook; Jun Lee, Gwang; Kim, Joonwoo; Moon Jeong, Soon; Kim, Jung-Hye

• Book ID: 121015918
• Publisher: American Institute of Physics
• Year: 2013
• Tongue: English
• Weight: 968 KB
• Volume: 114
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.4819886