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Analysis of sidewall quality in through-wafer deep reactive-ion etching

✍ Scribed by W.T. Pike; W.J. Karl; S. Kumar; S. Vijendran; T. Semple


Book ID
113797616
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
612 KB
Volume
73-74
Category
Article
ISSN
0167-9317

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