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Analysis of SiC IMPATT device in millimeter-wave frequencies

✍ Scribed by C. C. Meng; G. R. Liao


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
104 KB
Volume
18
Category
Article
ISSN
0895-2477

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✦ Synopsis


SiC IMPATT de¨ices ha¨e an efficiency and power ad¨antage o¨er Si and GaAs IMPATT de¨ices at millimeter-wa¨e frequencies. A lucky drift model describing ionization rates as a function of electric fields at high temperatures has been incorporated into a Read-type ( large-signal model. The simulation demonstrates that the efficiency and ) ( ) q dc power density at operating temperature 800 K for SiC p n single-( 2 ) drift flat-profile IMPATT structures is 12.4% 6.7 MWrcm , 15% ( 2 ) ( 2 ) 4.5 MWrcm , and 15.8% 3.3 MWrcm for frequencies of 200, 100, and 50 GHz, respecti¨ely.


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