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Analysis of ion energy impact on the refractive index of silicon nitride films by use of neural network model

✍ Scribed by Daehyun Kim; Byungwhan Kim

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Use of neural network to model the depos

✍ Kim, Byungwhan; Park, Kyungyoung; Lee, Dukwoo 📂 Article 📅 2005 🏛 Institute of Physics 🌐 English ⚖ 188 KB

Modeling refraction characteristics of s

✍ Byungwhan Kim; Seung-Soo Han; Tae Seon Kim; Bum Soo Kim; Il Joo Shim 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 628 KB