Theoretical equations for fluorescent count rates from bulks, single-layer films, and multiple-layer film specimens, based on fundamental parameter models, are developed. Absorption and secondary enhancement within each layer, between layers, and between layers and substrate are considered. A comput
โฆ LIBER โฆ
Analysis of high-temperature superconducting films by X-ray fluorescence analysis
โ Scribed by V. Kliment
- Book ID
- 112707709
- Publisher
- Springer
- Year
- 1991
- Tongue
- English
- Weight
- 157 KB
- Volume
- 155
- Category
- Article
- ISSN
- 1588-2780
No coin nor oath required. For personal study only.
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