X-ray microdiffraction analysis of mm-scale orientational correlations in Tl-1223 high-critical-current, high-temperature superconducting films
✍ Scribed by E.D. Specht; A. Goyal; D.M. Kroeger; J.A. DeLuca; J.E. Tkaczyk; C.L. Briant; J.A. Sutliff
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 859 KB
- Volume
- 226
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
T1,_,.BaZCazCujO,. ~~0.2, (TI-1223) films grow'n on polycrystalline yttria-stabilized rirconia (YSZ) substrates rxhibrt a microstructure common in high-critical-current, high-temperature superconducting films. Plate-like grains are aligned wnh ('axes normal to the film; u-and h-axes are randomly oriented on a macroscopic scale. WC describe X-ray pole-figure measurcments from 0.1 mm regions of Tl-1223 films. For samples with the highest critical currents, the u-axes of the grains arc locally aligned over distances up to I mm. Regions of higher critical current are associated with regions of high u-axis alignment.