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Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

โœ Scribed by Simone Borri; Magali Hage-Hassan; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel


Publisher
Springer US
Year
2005
Tongue
English
Weight
497 KB
Volume
21
Category
Article
ISSN
0923-8174

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