Testing for functional defects in embedded digital-to-analogue converters using dynamic stimuli and transient response analysis

✍ Scribed by D. Taylor; P.S.A. Evans; T.I. Pritchard

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 562 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/0026-2692(94)90066-3