Testing for functional defects in embedded digitial-to-analogue converters using dynamic stimuli and transient response analysis : D. Taylor, P. S. A. Evans and T. I. Pritchard. Microelectronics Journal, 25, 415 (1994)

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 114 KB
• Volume: 36
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(96)81977-9