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Analysis of defects in weakly damaged GaAs by Monte Carlo channeling simulation

✍ Scribed by A. Dygo; J. Kaczanowski; A. Turos; W. Wesch; K. Gärtner; G. Götz

Book ID
113283025
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
277 KB
Volume
64
Category
Article
ISSN
0168-583X

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