Monte Carlo methods in defects migration—Spontaneous annealing of damage induced by ion implantation

✍ Scribed by Mazzone, A.M.

• Book ID: 114595288
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 672 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1985.22224