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Analysis of Co and Cr dopants in epitaxial films of β-FeSi2 by ERDA, RBS, EDX and AES

✍ Scribed by W. Bohne; G.-U. Reinsperger; J. Röhrich; A. Schöpke; B. Selle; I. Sieber; P. Stauß; I. Urban

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Comparative concentration analysis of Cr

✍ W Bohne; G.-U Reinsperger; J Röhrich; G Röschert; B Selle; P Stauß 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 149 KB

Compositional analysis of thin SiOxNy:H

✍ W Bohne; J Röhrich; A Schöpke; B Selle; I Sieber; W Fuhs; Á del Prado; E San And 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 393 KB

Comparative composition analysis of SiOx

✍ I. Sieber, A. Schöpke, B. Selle 📂 Article 📅 1995 🏛 Springer 🌐 English ⚖ 244 KB

X-ray and luminescent analysis of finely

✍ R. M. Bayazitov; R. I. Batalov; E. I. Terukov; V. Kh. Kudoyarova 📂 Article 📅 2001 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 54 KB