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Analysis of carbon content and distribution in a-Si1−xCx:H films by resonant scattering

✍ Scribed by S.H. Sie; D.R. McKenzie; G.B. Smith; C.G. Ryan

Book ID: 113277782
Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 343 KB
Volume: 15
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(86)90382-4

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