Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental
Analysis of archaeological ceramics by total-reflection X-ray fluorescence: Quantitative approaches
✍ Scribed by R. Fernández-Ruiz; M. Garcia-Heras
- Book ID
- 108261689
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 384 KB
- Volume
- 63
- Category
- Article
- ISSN
- 0584-8547
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
This paper reviews and discusses the error factors in quantitative total reflection x-ray fluorescence analysis, primarily with regard to the surface contamination of silicon wafers. The error factors were classified into three origins: instrumental, sample and data processing. The instrumental erro
Measurements of X-ray fluorescence spectra versus grazing incident angles provide information on elemental composition as well as density and thickness of near surface layers. Calculations of fluorescence intensities are presented, which are used for the evaluation of data obtained by total reflecti